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Opis

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

Szczegóły książki

Kategoria Książki po angielsku Mathematics & science Science: general issues Scientific equipment, experiments & techniques

• Pełny tytuł: Noncontact Atomic Force Microscopy
• Autor: Seizo Morita, Roland Wiesendanger, Ernst Meyer
• Język: Angielski
• Oprawa: Twarda
• Liczba stron: 440
• EAN: 9783540431176
• ISBN: 3540431179
• ID: 01564043
• Wydawca: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
• Waga: 912 g
• Wymiary: 241 × 164 × 35 mm
• Data wydania: 24. July 2002

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