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Opis

Authored by an experienced university teacher and based on his lectures, this textbook answers the questions students really ask instead of delving into esoteric details. It adopts a well-balanced approach, with visual, intuitive understanding taking precedence over formalism, and only including as much mathematics as necessary.§Both dynamical and kinematic X-ray diffraction is considered from a unified viewpoint, based on the fundamental laws that govern the interaction of X-rays with matter. The text is focused on basic concepts, but also covers in detail such classical and modern applications as line broadening, texture and strain/stress analyses, X-ray mapping in reciprocal space, high-resolution X-ray diffraction, and inelastic X-ray scattering. This unique scope, in combination with the otherwise hard-to-find information on X-ray focusing components, X-ray interaction with phonons, coherent scattering of Mössbauer radiation, and the interrelation between grain size-mediated and microstrain fluctuation-induced broadenings of X-ray diffraction profiles, makes this indispensable reading for any serious user of X-ray diffraction techniques. Numerous clear-cut illustrations, an easy-to-read style of writing, as well as short, easily digestible chapters all facilitate comprehension.§Compact and self-contained, the text is suitable for x-ray diffraction courses in materials science, physics, chemistry, and biology, irrespective of the reader?s academic background.

Szczegóły książki

Kategoria Książki po angielsku Mathematics & science Physics Particle & high-energy physics

• Pełny tytuł: Basic Concepts of X-Ray Diffraction
• Autor: Emil Zolotoyabko
• Język: Angielski
• Oprawa: Miękka
• Liczba stron: 312
• EAN: 9783527335619
• ISBN: 3527335617
• ID: 02126956
• Wydawca: Wiley-VCH Verlag GmbH
• Waga: 682 g
• Wymiary: 244 × 171 × 16 mm
• Data wydania: 12. March 2014

Ulubione w innej kategorii

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