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Więcej informacji o Kelvin Probe Force Microscopy

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Opis

Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.

Szczegóły książki

Kategoria Książki po angielsku Mathematics & science Physics Thermodynamics & heat

• Pełny tytuł: Kelvin Probe Force Microscopy
• Podtytuł: Measuring and Compensating Electrostatic Forces
• Autor: Sascha Sadewasser, Thilo Glatzel
• Język: Angielski
• Oprawa: Twarda
• Liczba stron: 334
• EAN: 9783642225659
• ISBN: 3642225659
• ID: 01658439
• Wydawca: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
• Waga: 656 g
• Wymiary: 242 × 162 × 25 mm
• Data wydania: 21. October 2011

Ulubione w innej kategorii

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