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Więcej informacji o Nanometrology Using Transmission Electron Microscopy

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Opis

The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.

Szczegóły książki

Kategoria Książki po angielsku Technology, engineering, agriculture Technology: general issues Instruments & instrumentation engineering

• Pełny tytuł: Nanometrology Using Transmission Electron Microscopy
• Autor: Vlad Stolojan
• Język: Angielski
• Oprawa: Miękka
• Liczba stron: 85
• EAN: 9781681740560
• ISBN: 9781681740560
• ID: 10836624
• Wydawca: Morgan & Claypool Publishers
• Waga: 156 g
• Wymiary: 256 × 178 × 10 mm
• Data wydania: 30. September 2015

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