Zobacz książki o podobnej tematyce

Więcej informacji o Noncontact Atomic Force Microscopy

• Dane szczegółowe
• Opis
• Ulubione w innej kategorii

Za ten zakup dostaniesz 742 punkty

Opis

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

Szczegóły książki

Kategoria Książki po angielsku Mathematics & science Chemistry Analytical chemistry

• Pełny tytuł: Noncontact Atomic Force Microscopy
• Podtytuł: Volume 2
• Autor: Seizo Morita, Roland Wiesendanger, Franz J. Giessibl
• Język: Angielski
• Oprawa: Twarda
• Liczba stron: 401
• EAN: 9783642014949
• ISBN: 3642014941
• ID: 01649678
• Wydawca: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
• Waga: 870 g
• Wymiary: 235 × 155 × 30 mm
• Data wydania: 12. August 2009

Ulubione w innej kategorii

---

---

---