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Opis

Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation presents several methods to determine the reliability of infrared LEDs. The book focuses on the method to extract fundamental parameters from electrical and optical characterizations. The authors identify different parameters related to specific zones in components and then extract failure mechanisms based on measured performance-before and after aging tests. The knowledge of failure mechanisms allows you to extract degradation laws related to a physics equation so an accurate lifetime distribution can then be proposed. Deals exclusively with reliability, based on the physics of failure for infrared LEDsIdentifies failure mechanisms, lifetime distribution, and selection of the best component for dedicated applicationsUses a complete methodology to reduce the number of samples needed to estimate lifetime distributionFocuses on the method to extract fundamental parameters from electrical and optical characterizations

Szczegóły książki

Kategoria Książki po angielsku Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Pełny tytuł: Reliability, Robustness and Failure Mechanisms of LED Devices
• Podtytuł: Methodology and Evaluation
• Autor: Yannick Deshayes, Laurent BĂ©chou
• Język: Angielski
• Oprawa: Twarda
• Liczba stron: 172
• EAN: 9781785481529
• ISBN: 1785481525
• ID: 02984068
• Wydawca: ISTE Press Ltd - Elsevier Inc
• Waga: 432 g
• Wymiary: 238 × 158 × 15 mm
• Data wydania: 23. September 2016

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