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Opis

General trace and log analysis patterns allow application of uniform problem detection and solving approach across diverse software environments. This pattern language covers any execution artifact from a small debugging trace to a distributed log with billions of messages from hundreds of computers, thousands of software components, threads, and processes. Pattern-oriented trace and log analysis is applicable to troubleshooting and debugging Windows, Mac OS X, Linux, FreeBSD, Android, iOS, z/OS, and any other possible computer platform including networking and IoT. Its pattern catalog is a part of pattern-oriented software diagnostics, forensics, prognostics, root cause analysis, and debugging developed by Software Diagnostics Institute (DumpAnalysis.org + TraceAnalysis.org). This reference reprints with corrections 133 patterns originally published in Memory Dump Analysis Anthology volumes 3 - 9 and Software Diagnostics Library (former Crash Dump Analysis blog, DumpAnalysis.org/blog). Full-color diagrams accompany most pattern descriptions. The second edition includes 33 more patterns and improved pattern index.

Szczegóły książki

Kategoria Książki po angielsku Computing & information technology Computer programming / software development Software Engineering

• Pełny tytuł: Software Trace and Log Analysis
• Podtytuł: A Pattern Reference
• Autor: Dmitry Vostokov, Software Diagnostics Institute
• Język: Angielski
• Oprawa: Miękka
• Liczba stron: 224
• EAN: 9781908043825
• ISBN: 1908043822
• ID: 15628836
• Wydawca: Opentask
• Waga: 366 g
• Wymiary: 216 × 140 × 14 mm
• Data wydania: 30. November 2016

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