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Więcej informacji o Transmission Electron Microscopy

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Opis

Transmission Electron Microscopy presents the theory of image andcontrast formation, and the analytical modes in transmission electronmicroscopy. The principles of particle and wave optics of electronsare described. Electron-specimen interactions are discussed forevaluating thetheory of scattering and phase contrast. Also discussed are thekinematical and dynamical theories of electron diffraction and theirapplications for crystal-structure analysis andimaging of latticesand their defects. X-ray micronanalysis and electron energy-lossspectroscopy are treated as analytical methods. Specimen damage andcontamination by electron irradiation limits theresolution for biological and some inorganic specimens. This fifthedition includes discussion of recent progress, especially in the areaof aberration corrector, and energy filtering; moreover the new topicsof the forth edition have been updated again.

Szczegóły książki

Kategoria Książki po angielsku Technology, engineering, agriculture Other technologies & applied sciences Applied optics

• Pełny tytuł: Transmission Electron Microscopy
• Podtytuł: Physics of Image Formation
• Autor: Ludwig Reimer, Helmut Kohl
• Język: Angielski
• Oprawa: Twarda
• Liczba stron: 590
• EAN: 9780387400938
• ISBN: 0387400931
• ID: 01382120
• Wydawca: Springer-Verlag New York Inc.
• Waga: 1068 g
• Wymiary: 242 × 166 × 36 mm
• Data wydania: 28. August 2008

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