Zobacz książki o podobnej tematyce

Więcej informacji o Electromigration and Electronic Device Degradation

• Dane szczegółowe
• Opis
• Ulubione w innej kategorii

Za ten zakup dostaniesz 759 punkty

Opis

Electromigration is a mass transport effect in metals under high current densities, which causes the metal atoms to migrate away from a high current density point and leads to the failure of integrated circuits. It is therefore an important reliability issue. This study reviews the topic for both the silicon and GaAs technologies. It surveys the status of electromigration physics in microelectronics, and summarizes various rate controlling details, including an investigation of temperature dependence.

Szczegóły książki

Kategoria Książki po angielsku Technology, engineering, agriculture Mechanical engineering & materials Production engineering

• Pełny tytuł: Electromigration and Electronic Device Degradation
• Autor: Christou
• Język: Angielski
• Oprawa: Twarda
• Liczba stron: 344
• EAN: 9780471584896
• ISBN: 0471584894
• ID: 04892340
• Wydawca: John Wiley & Sons Inc
• Waga: 656 g
• Wymiary: 239 × 164 × 25 mm
• Data wydania: 07. February 1994

Ulubione w innej kategorii

---

---

---